Breakthrough Papers in Nature Materials and Advanced Materials Unveil Nano-scale Material Insights
By Francesca Rameau, Written Communications Assistant
The extreme resolution possible with UConn’s novel Tomographic AFM is demonstrated by the full 3-D map of ferroelectric domains (color, top), and magnified image just of domain walls (base), for a crystal of multiferroic ErMnO3 reported in the Advanced Materials publication. This work incorporated 403 raw images, 633 million total data voxels, and depth resolution better than 5 nm.
Professor Bryan Huey, Head of the MSE Department, has coauthored two papers published in the prestigious journals Nature Materials and Advanced Materials. Nature Materials, a leading monthly journal in materials science and engineering, showcases top-tier research across all disciplines within the field. Advanced Materials, renowned for over 30 years, serves as a cornerstone for the finest achievements in materials science globally.
Huey’s current and former Ph.D. students are coauthors and led UConn’s important contributions to these multinational efforts, especially Karla Del Cid-Ledezma and Dr. Thomas Moran. Both papers feature the Tomographic AFM method, which is unique to our lab at UConn because we are able to provide otherwise inaccessible nano-volumetric insights into the functional properties of materials. For the Advanced Materials paper, we studied the beautiful and property-defining curvature of ferroelectric domain walls in multiferroic crystals, while the Nature Materials paper analyzed thickness-dependent morphologies of ferroelectric domains that are less than just five units cells thick.
Published: April 2, 2024
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